Fölsch, S.; Meyer, G.; Winau, D.; Rieder, K.H.; Schmidt, T.; Horn-von Hoegen, Michael:

Reconstruction dependent orientation of Ag(111) films on Si(001)

In: Physical Review B, Jg. 52 (1995) ; Nr. 19, S. 13745-13748
ISSN: 1098-0121, 1550-235X
Zeitschriftenaufsatz / Fach: Physik
Fakultät für Physik » Experimentalphysik
Abstract:
The growth of Ag on 4°-misoriented, single-domain Si(001) surfaces at 130 K yields continuous and epitaxial overlayers with a (111) orientation. The close-packed rows of Ag atoms are parallel to the (2×1) dimer rows and run perpendicular to the step edges. The dimer orientation can be rotated by 90° by inducing a (3×2) reconstruction on the Si(001) surface. Again, single-crystal Ag(111) films are obtained; however, their in-plane orientation is now rotated by 90°. In this case, the close-packed rows of Ag atoms are aligned parallel to the step edges.

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