Fölsch, S.; Meyer, G.; Winau, D.; Rieder, K.H.; Schmidt, T.; Horn-von Hoegen, Michael:
Reconstruction dependent orientation of Ag(111) films on Si(001)
1995
In: Physical Review B, Jg. 52 (1995), Heft 19, S. 13745 - 13748
Artikel/Aufsatz in Zeitschrift1995Physik
Fakultät für Physik » Experimentalphysik
Titel:
Reconstruction dependent orientation of Ag(111) films on Si(001)
Autor(in):
Fölsch, S.; Meyer, G.; Winau, D.; Rieder, K.H.; Schmidt, T.; Horn-von Hoegen, MichaelLSF
Erscheinungsjahr
1995
WWW URL

Abstract:

The growth of Ag on 4°-misoriented, single-domain Si(001) surfaces at 130 K yields continuous and epitaxial overlayers with a (111) orientation. The close-packed rows of Ag atoms are parallel to the (2×1) dimer rows and run perpendicular to the step edges. The dimer orientation can be rotated by 90° by inducing a (3×2) reconstruction on the Si(001) surface. Again, single-crystal Ag(111) films are obtained; however, their in-plane orientation is now rotated by 90°. In this case, the close-packed rows of Ag atoms are aligned parallel to the step edges.