Diesing, Detlef; Kovacs, Domocos; Stella, Kevin; Heuser, Christian:
Characterization of atom and ion-induced "internal" electron emission by thin film tunnel junctions
2011
In: Nuclear instruments & methods in physics research / Section B, Beam interactions with materials and atoms, Jg. 269 (2011), Heft 11, S. 1185 - 1189
Artikel/Aufsatz in Zeitschrift2011Chemie
Fakultät für Chemie » Physikalische Chemie
Titel:
Characterization of atom and ion-induced "internal" electron emission by thin film tunnel junctions
Autor(in):
Diesing, DetlefLSF; Kovacs, Domocos; Stella, Kevin; Heuser, ChristianLSF
Erscheinungsjahr
2011
DOI: