Falta, J.; Bahr, D.; Materlik, G.; Müller, B.H.; Horn-von Hoegen, Michael:

X-ray characterization of buried delta layers

In: Surface Review and Letters, Jg. 5 (1998), S. 145-149
ISSN: 1793-6640
Zeitschriftenaufsatz / Fach: Physik
Fakultät für Physik » Experimentalphysik
A combination of measurements of crystal truncation roda and X-ray standing waves has been used for a detailed characterization of buried Ge δ layers on Si(001). Measurements of crystal truncation rods reveal the interface roughness, the δ layer lattice constant and the δ layer concentration. From measurements with X-ray standing waves the dopant lattice position and crystallinity of the δ layer are determined. We find a linear dependence of the local tetragonal distortion of the Ge bonding in the δ layer on the Ge concentration in the layer.

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