Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Barty, Christopher P.P.; Squier, J.A.; Wilson, Kent R.; Kammler, Martin:

Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast x-ray diffraction

In: Journal de Physique . IV France, Jg. 11 (2001) ; PR2, S. 473 - 477
ISSN: 1155-4304
Zeitschriftenaufsatz / Fach: Physik
Fakultät für Physik » Experimentalphysik
Using time-resolved x-ray diffraction ultafast lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures has been studied. This experimental technique uniquely allows us to observe fast energy transport deep into the bulk of the material, coherent acoustic phonon dynamics, lattice anharmonicity, and vibrational transport across a buried interface.