Sokolowski-Tinten, Klaus; Horn-von Hoegen, Michael; von der Linde, Dietrich; Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Barty, Christopher P.P.; Squier, J.A.; Wilson, Kent R.; Kammler, Martin:
Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast x-ray diffraction
2001
In: Journal de Physique . IV France, Jg. 11 (2001), Heft PR2, S. 473 - 477
Artikel/Aufsatz in Zeitschrift2001Physik
Fakultät für Physik » Experimentalphysik
Titel:
Transient lattice dynamics in fs-laser-excited semiconductors probed by ultrafast x-ray diffraction
Autor(in):
Sokolowski-Tinten, KlausLSF; Horn-von Hoegen, MichaelLSF; von der Linde, DietrichLSF; Cavalleri, Andrea; Siders, Craig W.; Brown, F.L.H.; Leitner, D.M.; Tóth, Csaba; Barty, Christopher P.P.; Squier, J.A.; Wilson, Kent R.; Kammler, MartinLSF
Erscheinungsjahr
2001
DOI:
Erschienen in:
Titel:
Journal de Physique . IV France
in:
Jg. 11 (2001), Heft PR2, S. 473 - 477
ISSN:

Abstract:

Using time-resolved x-ray diffraction ultafast lattice dynamics in fs-laser-excited crystalline bulk Ge and Ge/Si-heterostructures has been studied. This experimental technique uniquely allows us to observe fast energy transport deep into the bulk of the material, coherent acoustic phonon dynamics, lattice anharmonicity, and vibrational transport across a buried interface.