Meyer zu Heringdorf, Frank; Pietsch, H.; Horn-von Hoegen, Michael:
Reciprocal Space Mapping by spot profile analyzing low energy electron diffraction
2005
In: Review of Scientific Instruments, Jg. 76 (2005), Heft 8, S. 85102
Artikel/Aufsatz in Zeitschrift2005Physik
Fakultät für Physik » Experimentalphysik
Titel:
Reciprocal Space Mapping by spot profile analyzing low energy electron diffraction
Autor(in):
Meyer zu Heringdorf, FrankLSF; Pietsch, H.; Horn-von Hoegen, MichaelLSF
Erscheinungsjahr
2005
WWW URL

Abstract:

We present an experimental approach for the recording of two-dimensional reciprocal space maps using spot profile analyzing low energy electron diffraction (SPA-LEED). A specialized alignment procedure eliminates the shifting of LEED patterns on the screen which is commonly observed upon variation of the electron energy. After the alignment, a set of one-dimensional sections through the diffraction pattern is recorded at different energies. A freely available software tool is used to assemble the sections into a reciprocal space map. The necessary modifications of the Burr-Brown computer interface of the two Leybold and Omicron type SPA-LEED instruments are discussed and step-by-step instructions are given to adapt the SPA 4.1d software to the changed hardware. Au induced faceting of 4° vicinal Si(001) is used as an example to demonstrate the technique.