Janzen, A.; Krenzer, B.; Zhou, Ping; von der Linde, Dietrich; Horn-von Hoegen, Michael:
Ultrafast electron diffraction at surfaces after laser excitation
2006
In: Surface Science, Jg. 600 (2006), Heft 18, S. 4094 - 4098
Artikel/Aufsatz in Zeitschrift2006Physik
Fakultät für Physik » Experimentalphysik
Titel:
Ultrafast electron diffraction at surfaces after laser excitation
Autor(in):
Janzen, A.; Krenzer, B.; Zhou, PingLSF; von der Linde, DietrichLSF; Horn-von Hoegen, MichaelLSF
Erscheinungsjahr
2006
WWW URL

Abstract:

Ultrafast electron diffraction in a RHEED setup is used to determine the dynamics of surface temperature of an epitaxial thin Bismuth-film on a Si(0 0 1) substrate upon fs-laser excitation. A transient temperature rise by 120 K is followed by a slow exponential cooling with time constant 640 ps. The surface cooling rate deviates from simple heat diffusion and is dominated by total internal reflection of ballistic phonons at the Bi/Si-interface which determines the thermal properties of the hetero-system.