Krenzer, B.; Janzen, A.; Zhou, Ping; von der Linde, Dietrich; Horn-von Hoegen, Michael:
Thermal Boundary Conductance in Heterostructures Studied by Ultrafast Electron Diffraction,
2006
In: New Journal of Physics, Band 8 (2006), S. 190
Artikel/Aufsatz in Zeitschrift / Fach: Physik
Fakultät für Physik » Experimentalphysik
Titel:
Thermal Boundary Conductance in Heterostructures Studied by Ultrafast Electron Diffraction,
Autor(in):
Krenzer, B.; Janzen, A.; Zhou, Ping im Online-Personal- und -Vorlesungsverzeichnis LSF anzeigen; von der Linde, Dietrich im Online-Personal- und -Vorlesungsverzeichnis LSF anzeigen; Horn-von Hoegen, Michael im Online-Personal- und -Vorlesungsverzeichnis LSF anzeigen
Erscheinungsjahr:
2006
Erschienen in:
New Journal of Physics, Band 8 (2006), S. 190
ISSN:
Link URL:

Abstract:

Ultrafast electron diffraction (UED) at surfaces is used to study the energy dissipation in ultrathin epitaxial Bi-films on Si(001) subsequent to fs laser pulse excitation. The temperature of the Bi-film is determined from the drop in diffraction intensity due to the Debye–Waller effect. A temperature rise from 80 to 200 K is followed by an exponential cooling with a time constant of 640 ps. The cooling rate of the Bi-film is determined by the reflection of phonons at the Bi/Si interface and is slower than expected from the acoustic and diffusive mismatch model.