Thermal Boundary Conductance in Heterostructures Studied by Ultrafast Electron Diffraction,
In: New Journal of Physics (NJP), Band 8 (2006), S. 190
2006Artikel/Aufsatz in Zeitschrift
Physik (inkl. Astronomie)Fakultät für Physik » Experimentalphysik
Damit verbunden: 1 Publikation(en)
Titel:
Thermal Boundary Conductance in Heterostructures Studied by Ultrafast Electron Diffraction,
Autor*in:
Krenzer, B.;Janzen, A.;Zhou, PingUDE
- LSF ID
- 10448
- Sonstiges
- der Hochschule zugeordnete*r Autor*in
- GND
- 121993092X
- LSF ID
- 10402
- ORCID
- 0000-0001-5618-3879
- Sonstiges
- der Hochschule zugeordnete*r Autor*in
- GND
- 1201039908
- LSF ID
- 10366
- ORCID
- 0000-0003-0324-3457
- Sonstiges
- der Hochschule zugeordnete*r Autor*in
Erscheinungsjahr:
2006
Abstract:
Ultrafast electron diffraction (UED) at surfaces is used to study the energy dissipation in ultrathin epitaxial Bi-films on Si(001) subsequent to fs laser pulse excitation. The temperature of the Bi-film is determined from the drop in diffraction intensity due to the Debye–Waller effect. A temperature rise from 80 to 200 K is followed by an exponential cooling with a time constant of 640 ps. The cooling rate of the Bi-film is determined by the reflection of phonons at the Bi/Si interface and is slower than expected from the acoustic and diffusive mismatch model.