Photoemission electron microscopy study of anthracene growth on Si(111)

In: Surface Science, Jg. 601 (2007) ; Nr. 7, S. 1701-1704
ISSN: 0039-6028
Zeitschriftenaufsatz / Fach: Physik
Fakultät für Physik » Experimentalphysik
The thin film growth of anthracene films on Si(1 1 1) surfaces is studied by photoemission electron microscopy (PEEM). The thin film growth of anthracene on Si(1 1 1) is similar to the growth of pentacene on silicon. Initially a layer of flat lying molecules chemisorbs on the surface. Subsequent growth of fractal islands with standing up molecules proceeds on top of this flat layer.