Domain Sensitive Contrast in Photoelectron Emission Microscopy
We have investigated the adsorption of cesium on the Si(100) surface with photoelectron emission microscopy using linearly polarized green laser light. We observe a polarization dependent contrast between the (2×1) or (1×2) reconstructed terraces. Density-functional calculations reveal the geometric and electronic structure of the Cs/Si(100) surface. The contrast between the (2×1) or (1×2) reconstructed domains is explained on the basis of dipole selection rules for the photoemission matrix elements.
Dieser Eintrag ist freigegeben.