Domain Sensitive Contrast in Photoelectron Emission Microscopy
In: Physical Review Letters, Jg. 99 (2007) ; Nr. 19, S. 196102 (4p)
ISSN: 0031-9007, 1079-7114
Zeitschriftenaufsatz / Fach: Physik
Fakultät für Physik » Experimentalphysik
We have investigated the adsorption of cesium on the Si(100) surface with photoelectron emission microscopy using linearly polarized green laser light. We observe a polarization dependent contrast between the (2×1) or (1×2) reconstructed terraces. Density-functional calculations reveal the geometric and electronic structure of the Cs/Si(100) surface. The contrast between the (2×1) or (1×2) reconstructed domains is explained on the basis of dipole selection rules for the photoemission matrix elements.