Hanisch-Blicharski, Anja; Krenzer, Boris; Möllenbeck, Simone; Ligges, Manuel; Zhou, Ping; Kammler, Martin; Horn-von Hoegen, Michael:
Transient Cooling of Ultrathin Epitaxial Bi(111)-Films on Si(111) upon Femtosecond Laser Excitation Studied by Ultrafast Reflection High Energy Electron Diffraction"
2009
In: MRS Proceedings, Band 1172 (2009), S. 4 - 8
Artikel/Aufsatz in Zeitschrift2009Physik
Fakultät für Physik » Experimentalphysik
Titel:
Transient Cooling of Ultrathin Epitaxial Bi(111)-Films on Si(111) upon Femtosecond Laser Excitation Studied by Ultrafast Reflection High Energy Electron Diffraction"
Autor(in):
Hanisch-Blicharski, AnjaLSF; Krenzer, Boris; Möllenbeck, Simone; Ligges, ManuelLSF; Zhou, PingLSF; Kammler, MartinLSF; Horn-von Hoegen, MichaelLSF
Erscheinungsjahr
2009
WWW URL
Erschienen in:
Titel:
MRS Proceedings
in:
Band 1172 (2009), S. 4 - 8
ISSN:

Abstract:

With time resolved ultrafast electron diffraction the cooling process across the interface between a thin film and the underlying substrate was studied after excitation with short laser pulses. From the exponential decay of the surface temperature evolution a thermal boundary conductance of 1430 W/(cm2K) is determined for a 9.7 nm thin Bi(111) film on Si(111). A linear dependence between laser fluence and initial temperature rise was measured for film-thicknesses between 2.5 nm and 34.5 nm. The ratio of initial temperature rise and laser fluence for different film-thicknesses is compared to a model taking multilayer optics into account. The data agree well with this model.