Klein, Claudius; Nabbefeld, Tobias; Hattab, Hichem; Meyer, D.; Jnawali, Giriraj; Kammler, Martin; Meyer zu Heringdorf, Frank; Golla-Franz, A.; Müller, B.H.; Schmidt, T.H.; Henzler, M.; Horn-von Hoegen, Michael:

Lost in reciprocal space? Determination of scattering condition in spot profile analysis low energy electron diffraction

In: Review of Scientific Instruments, Jg. 82 (2011) ; Nr. 3, S. 35111 (7p)
ISSN: 1089-7623, 0034-6748
Zeitschriftenaufsatz / Fach: Physik
Fakultät für Physik » Experimentalphysik
The precise knowledge of the diffraction condition, i.e., the angle of incidence and electron energy, is crucial for the study of surface morphology through spot profile analysis low-energy electron diffraction (LEED). We demonstrate four different procedures to determine the diffraction condition: employing the distortion of the LEED pattern under large angles of incidence, the layer-by-layer growth oscillations during homoepitaxial growth, a G(S) analysis of a rough surface, and the intersection of facet rods with 3D Bragg conditions.