Wiggers, Hartmut; Hülser, Tim-Patrick; Kennedy, Marcus; Kruis, Frank Einar; Fissan, Heinz; Lorke, Axel; Roth, Paul:
Electrical Properties of Nanocrystalline SnO2 Thin Film Sensors Investigated with Impedance Spectroscopy
In: Emerging applications in electronics, optoelectronics, energy and sensors : Chemical Nanotechnology Talks IV ; 01 - 02 October 2003, DECHEMA-Building, Frankfurt am Main - Frankfurt/Main, 2003
Buchaufsatz/Kapitel in Sammelwerk2003Maschinenbau
Titel:
Electrical Properties of Nanocrystalline SnO2 Thin Film Sensors Investigated with Impedance Spectroscopy
Autor(in):
Wiggers, HartmutLSF; Hülser, Tim-PatrickLSF; Kennedy, MarcusLSF; Kruis, Frank EinarLSF; Fissan, HeinzLSF; Lorke, AxelLSF; Roth, PaulLSF
Erscheinungsjahr
2003