Jin, Z.; Neumann, Stefan; Prost, Werner; Tegude, Franz-Josef:
Passivation of InP/GaAsSb/InP double heterostructure bipolar transistors with ultra thin base layer by low-temperature deposited SiNx
2005
In: Solid-State Electronics, Jg. Vol. 49 (2005), Heft No. 3, S. 409 - 412
Artikel/Aufsatz in Zeitschrift2005Elektrotechnik
Titel:
Passivation of InP/GaAsSb/InP double heterostructure bipolar transistors with ultra thin base layer by low-temperature deposited SiNx
Autor(in):
Jin, Z.; Neumann, Stefan; Prost, WernerLSF; Tegude, Franz-JosefLSF
Erscheinungsjahr
2005

Abstract:

The InP/GaAsSb/InP double heterostructure bipolar transistors with 20-nm-thick base layer are passivated by low-temperature deposited SiNx. The SiNx passivation results in an increase of the current gain, seen from common-emitter I–V characteristics. An improvement of the Early voltage is also observed after the passivation. The study of the forward Gummel plots shows that the collector current keeps unchanged, while the base current decreases after SiNx passivation. A decrease of the base current ideality factor is found by the SiNx passivation. The passivation also results in an improvement of the base–collector junction. In contrast, the leakage current of the base–collector junction increases tow orders after passivation.