Alkeev, N. V.; Averin, S. V.; Dorofeev, A. A; Velling, P.; Khorenko, E.; Prost, Werner; Tegude, Franz-Josef:

Sequential mechanism of electron transport in the resonant tunneling diode with thick barriers

In: Semiconductors, Jg. Vol. 41 (2007) ; No. 2, S. 227 - 231
ISSN: 1063-7826, 1090-6479
Zeitschriftenaufsatz / Fach: Elektrotechnik
Abstract:
A frequency-dependent impedance analysis (0.1-50 GHz) of an InGaAs/InAlAs-based resonant tunneling diode with a 5-nm-wide well and 5-nm-thick barriers showed that the transport mechanism in such a diode is mostly sequential, rather than coherent, which is consistent with estimates. The possibility of determining the coherent and sequential  mechanism fractions in the electron transport through the resonant tunneling diode by its frequency dependence on the impedance is discussed.

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