Blekker, Kai; Münstermann, Benjamin; Matiss, Andreas; Do, Quoc-Thai; Regolin, Ingo; Brockerhoff, Wolfgang; Prost, Werner; Tegude, Franz-Josef:
High-Frequency Measurements on InAs Nanowire Field-Effect Transistors using Coplanar Waveguide Contacts
2010
In: IEEE transactions on nanotechnology, Jg. 9 (2010), Heft 4, S. 432 - 437
Artikel/Aufsatz in Zeitschrift2010Elektrotechnik
Titel:
High-Frequency Measurements on InAs Nanowire Field-Effect Transistors using Coplanar Waveguide Contacts
Autor(in):
Blekker, KaiLSF; Münstermann, BenjaminLSF; Matiss, Andreas; Do, Quoc-Thai; Regolin, Ingo; Brockerhoff, WolfgangLSF; Prost, WernerLSF; Tegude, Franz-JosefLSF
Erscheinungsjahr
2010