Hilner, Emelie; Håkanson, Ulf; Fröberg, Linus E.; Karlsson, Martin; Kratzer, Peter; Lundgren, Edvin; Samuelson, Lars; Mikkelsen, Anders:
Direct atomic scale imaging of III−V nanowire surfaces
In: Nano Letters, Jg. 11 (2008), Heft 8, S. 3978 - 3982
2008Artikel/Aufsatz in Zeitschrift
Physik (inkl. Astronomie)
Damit verbunden: 1 Publikation(en)
Titel:
Direct atomic scale imaging of III−V nanowire surfaces
Autor*in:
Hilner, Emelie;Håkanson, Ulf;Fröberg, Linus E.;Karlsson, Martin;Kratzer, PeterUDE
GND
105650420
LSF ID
14826
ORCID
0000-0001-5947-1366ORCID iD
ORCID
0000-0003-4790-4616ORCID iD
Sonstiges
der Hochschule zugeordnete*r Autor*in
;
Lundgren, Edvin;Samuelson, Lars;Mikkelsen, Anders
Erscheinungsjahr:
2008

Abstract:

We have succeeded in direct atomic scale imaging of the exterior surfaces of III−V nanowires by scanning tunneling microscopy (STM). By using atomic hydrogen, we expose the crystalline surfaces of InAs nanowires with regular InP segments in vacuum while retaining the wire morphology. We show images with atomic resolution of the two major types of InAs wurtzite nanowire surface facets and scanning tunneling spectroscopy (STS) data. Ab initio calculations of the lowest energy surface structures and simulated STM images, agree very well with experiments.