Hilner, Emelie; Håkanson, Ulf; Fröberg, Linus E.; Karlsson, Martin; Kratzer, Peter; Lundgren, Edvin; Samuelson, Lars; Mikkelsen, Anders:

Direct atomic scale imaging of III−V nanowire surfaces

In: Nano Letters, Jg. 11 (2008) ; Nr. 8, S. 3978 - 3982
Zeitschriftenaufsatz / Fach: Physik
We have succeeded in direct atomic scale imaging of the exterior surfaces of III−V nanowires by scanning tunneling microscopy (STM). By using atomic hydrogen, we expose the crystalline surfaces of InAs nanowires with regular InP segments in vacuum while retaining the wire morphology. We show images with atomic resolution of the two major types of InAs wurtzite nanowire surface facets and scanning tunneling spectroscopy (STS) data. Ab initio calculations of the lowest energy surface structures and simulated STM images, agree very well with experiments.