Critical behavior of strained epitaxial Gd films: In situ ac-susceptiblity measurements in UHV.
In: Physical Review B : Condensed matter and materials physics, Band 45 (1992), S. 503 - 506
Titel:
Critical behavior of strained epitaxial Gd films: In situ ac-susceptiblity measurements in UHV.
Autor*in:
Stetter, U.;Farle, MichaelUDE
- GND
- 1029383219
- LSF ID
- 3560
- ORCID
- 0000-0002-1864-3261
- Sonstiges
- der Hochschule zugeordnete*r Autor*in
Erscheinungsjahr:
1992