Klein, C.; Ramchal, R.; Schmid, A.K.; Farle, Michael:
Direct imaging of spin-reorientation transitions in ultrathin Ni films by spin-polarized low-energy electron microscopy.
2006
In: Surface and Interface Analysis, Jg. 38 (2006), Heft 12-13, S. 1550 - 1553
Artikel/Aufsatz in Zeitschrift2006Physik
Titel:
Direct imaging of spin-reorientation transitions in ultrathin Ni films by spin-polarized low-energy electron microscopy.
Autor(in):
Klein, C.; Ramchal, R.; Schmid, A.K.; Farle, MichaelLSF
Erscheinungsjahr
2006