Stahlmecke, Burkhard; Meyer zu Heringdorf, Frank; Chelaru, L.I.; Horn-von Hoegen, Michael; Roos, Kelly R.; Dumpich, Günter:
Electromigration in single-crystalline self-organized silver nanowires.
In: Applied Physics Letters, Jg. 88 (2006), Heft 5, 53122 (3p)
2006Artikel/Aufsatz in Zeitschrift
Physik (inkl. Astronomie)Fakultät für Physik » Experimentalphysik
Titel:
Electromigration in single-crystalline self-organized silver nanowires.
Autor*in:
Stahlmecke, Burkhard;Meyer zu Heringdorf, FrankUDE
LSF ID
48700
ORCID
0000-0002-5878-2012ORCID iD
Sonstiges
der Hochschule zugeordnete*r Autor*in
;
Chelaru, L.I.;Horn-von Hoegen, MichaelUDE
GND
1201039908
LSF ID
10366
ORCID
0000-0003-0324-3457ORCID iD
Sonstiges
der Hochschule zugeordnete*r Autor*in
;
Roos, Kelly R.;Dumpich, GünterUDE
LSF ID
1107
Sonstiges
der Hochschule zugeordnete*r Autor*in
Erscheinungsjahr:
2006

Abstract:

We present electromigration experiments on single-crystalline silver nanowires. The wires were grown on 4° vicinal silicon (100) substrates by self-organization and were contacted by electron beam lithography. The electromigration experiments were performed in situ in a scanning electron microscope at room temperature with constant dc conditions. In contrast to other experiments we observe void formation at the anode side of the wires. If the current is reversed, the electromigration behavior is also reversed