Wende, Heiko; Baberschke, K.:
Atomic EXAFS: evidence for photoelectron backscattering by interstitial charge densities
1999
In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, Band 103 (1999), S. 821 - 826
Artikel/Aufsatz in Zeitschrift1999Physik
Titel:
Atomic EXAFS: evidence for photoelectron backscattering by interstitial charge densities
Autor(in):
Wende, HeikoLSF; Baberschke, K.
Erscheinungsjahr
1999