Wende, Heiko; Baberschke, K.:

Atomic EXAFS: evidence for photoelectron backscattering by interstitial charge densities

In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, Jg. 103 (1999), S. 821-826
ISSN: 0368-2048
Zeitschriftenaufsatz / Fach: Physik