Srivastava, P.; Haack, N.; Wende, Heiko; Chauvistre, R.; Baberschke, K.:

Modifications of the electronic structure of Ni/Cu(001) as a function of the film thickness

In: PHYSICAL REVIEW B, Jg. 56 (1997) ; Nr. 8, S. R4398-R4401
ISSN: 0163-1829
Zeitschriftenaufsatz / Fach: Physik