Srivastava, P.; Haack, N.; Wende, Heiko; Chauvistre, R.; Baberschke, K.:
Modifications of the electronic structure of Ni/Cu(001) as a function of the film thickness
1997
In: PHYSICAL REVIEW B, Jg. 56 (1997), Heft 8, S. R4398 - R4401
Artikel/Aufsatz in Zeitschrift1997Physik
Titel:
Modifications of the electronic structure of Ni/Cu(001) as a function of the film thickness
Autor(in):
Srivastava, P.; Haack, N.; Wende, HeikoLSF; Chauvistre, R.; Baberschke, K.
Erscheinungsjahr
1997