Franzka, S.; Knell, G.; Pagnia, H.; Sotnik, N.:
Visualization of carbon layers in electroformed MIM diodes.
1994
In: International Journal of Electronics, Jg. 76 (1994), Heft 5, S. 723 - 725
Artikel/Aufsatz in Zeitschrift1994Chemie
Titel:
Visualization of carbon layers in electroformed MIM diodes.
Autor(in):
Franzka, S.LSF; Knell, G.; Pagnia, H.; Sotnik, N.
Erscheinungsjahr
1994

Abstract:

A photoemission electron microscope is used to detect thin carbon layers on the surface of an electroformed MIM sample. At the hot spots in the microslit electrons are emitted that impinge on the anode electrode cracking adsorbed hydrocarbons. Optical micrographs show a brownish layer, and STM images reveal disordered areas between patches with hexagonal symmetry and at. sepn. in graphite.