Franzka, S.; Knell, G.; Pagnia, H.; Sotnik, N.:

Visualization of carbon layers in electroformed MIM diodes.

In: International Journal of Electronics, Jg. 76 (1994) ; Nr. 5, S. 723-725
ISSN: 0020-7217
Zeitschriftenaufsatz / Fach: Chemie
A photoemission electron microscope is used to detect thin carbon layers on the surface of an electroformed MIM sample. At the hot spots in the microslit electrons are emitted that impinge on the anode electrode cracking adsorbed hydrocarbons. Optical micrographs show a brownish layer, and STM images reveal disordered areas between patches with hexagonal symmetry and at. sepn. in graphite.

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