Trace element determination by inductively coupled plasma mass spectrometry - ICP-MS.
A review, with 6 refs., describes trace element anal. by ICP-MS which was introduced as new anal. techniques in 1983. The description includes the interface between ICP as ion source and spectrometer, measuring techniques, efficiency, interferences, applications of ICP-MS, and concludes with some information on ICP-MS app. manufacturers.
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