Molt, Karl; Egelkraut, Marion; Gottwald, Karl Heinz:

Infrared analysis of thin inorganic and organic films on metals.

In: Mikrochimica acta (Mikrochim.Acta), Jg. 2 (1988) ; Nr. 1-6, S. 63-67
ISSN: 0026-3672
Zeitschriftenaufsatz / Fach: Chemie
Abstract:
IR spectroscopy is shown to be an adequate method for qual. and quant. characterization of tech. surface layers for corrosion protection. The measuring conditions for each type of sample have to be selected carefully. For the sake of reliability a certain redundancy in the evaluated data might be useful. It is the aim of this work to gather experience for routine quality control of steel and aluminum surfaces.

Dieser Eintrag ist freigegeben.