Molt, Karl; Egelkraut, Marion; Gottwald, Karl Heinz:
Infrared analysis of thin inorganic and organic films on metals.
1988
In: Mikrochimica acta (Mikrochim.Acta), Jg. 2 (1988), Heft 1-6, S. 63 - 67
Artikel/Aufsatz in Zeitschrift / Fach: Chemie
Titel:
Infrared analysis of thin inorganic and organic films on metals.
Autor(in):
Molt, Karl im Online-Personal- und -Vorlesungsverzeichnis LSF anzeigen; Egelkraut, Marion; Gottwald, Karl Heinz
Erscheinungsjahr:
1988
Erschienen in:
Mikrochimica acta (Mikrochim.Acta), Jg. 2 (1988), Heft 1-6, S. 63 - 67
ISSN:

Abstract:

IR spectroscopy is shown to be an adequate method for qual. and quant. characterization of tech. surface layers for corrosion protection. The measuring conditions for each type of sample have to be selected carefully. For the sake of reliability a certain redundancy in the evaluated data might be useful. It is the aim of this work to gather experience for routine quality control of steel and aluminum surfaces.