Siesler, H.w.:
Quality control and process monitoring by mid infrared, near infrared and Raman spectroscopy: A comparison.
2000
In: Near Infrared Spectroscopy, Proceedings of the International Conference, 9th, Verona, Italy, June 13-18, 1999, S. 331 - 337
Artikel/Aufsatz in Zeitschrift2000Chemie
Titel:
Quality control and process monitoring by mid infrared, near infrared and Raman spectroscopy: A comparison.
Autor(in):
Siesler, H.w.LSF
Erscheinungsjahr
2000

Abstract:

A review discusses the basic theory of the quality control and process monitoring by mid IR, near IR, and Raman spectroscopy. The presently available instrumentation and the various advantages and disadvantages of the different methods are summarized.