Siesler, H.w.:
Characterization of deformation phenomena in polymers by rapid-scanning Fourier transform infrared (FTIR) spectroscopy and mechanical measurements. I. The stress-induced crystalline phase transition in poly(butylene terephthalate).
1979
In: Journal of Polymer Science, Polymer Letters Edition, Jg. 17 (1979), Heft 7, S. 453 - 458
Artikel/Aufsatz in Zeitschrift / Fach: Chemie
Titel:
Characterization of deformation phenomena in polymers by rapid-scanning Fourier transform infrared (FTIR) spectroscopy and mechanical measurements. I. The stress-induced crystalline phase transition in poly(butylene terephthalate).
Autor(in):
Siesler, H.w. im Online-Personal- und -Vorlesungsverzeichnis LSF anzeigen
Erscheinungsjahr
1979
Erschienen in:
Journal of Polymer Science, Polymer Letters Edition, Jg. 17 (1979), Heft 7, S. 453 - 458
ISSN

Abstract:

The intensity changes in the CH2 absorption bands at 1460 (relaxed) and 1485 cm-1 (strained) bands in the FTIR spectra of poly(butylene terephthalate) [24968-12-5] as functions of strain are used to quant. represent structural transformation progress and may be correlated with mech. stress-strain diagrams and wide-angle x-ray results. Unlike x-ray diffraction measurements, IR spectroscopic changes characteristic of the phase transition, are obsd. at 2% strain and extend beyond 15% strain up to sample failure.